"A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of ..."

Rajat Butola, Yiming Li, Sekhar Reddy Kola (2022)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2022.3188690

access: open

type: Journal Article

metadata version: 2023-06-26

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/ButolaLK22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/ButolaLK22
Rajat Butola, Yiming Li, Sekhar Reddy Kola:
A Machine Learning Approach to Modeling Intrinsic Parameter Fluctuation of Gate-All-Around Si Nanosheet MOSFETs. IEEE Access 10: 71356-71369 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.