"An Attention-Augmented Convolutional Neural Network With Focal Loss for ..."

Uzma Batool et al. (2023)

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DOI: 10.1109/ACCESS.2023.3321025

access: open

type: Journal Article

metadata version: 2023-10-27

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Uzma Batool, Mohd Ibrahim Shapiai, Salama A. Mostafa, Mohd Zamri Ibrahim:
An Attention-Augmented Convolutional Neural Network With Focal Loss for Mixed-Type Wafer Defect Classification. IEEE Access 11: 108891-108905 (2023)

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