"AI-Powered Terahertz VLSI Testing Technology for Ensuring Hardware ..."

Naznin Akter et al. (2021)

> Home

Details and statistics

DOI: 10.1109/ACCESS.2021.3075429

access: open

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/access/AkterSSP21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/access/AkterSSP21
Naznin Akter, Masudur R. Siddiquee, Michael S. Shur, Nezih Pala:
AI-Powered Terahertz VLSI Testing Technology for Ensuring Hardware Security and Reliability. IEEE Access 9: 64499-64509 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.