"Device-Simulation-Based Machine Learning Technique for the Characteristic ..."

Chandni Akbar, Yiming Li, Narasimhulu Thoti (2022)

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DOI: 10.1109/ACCESS.2022.3174685

access: open

type: Journal Article

metadata version: 2023-03-19

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Chandni Akbar, Yiming Li, Narasimhulu Thoti:
Device-Simulation-Based Machine Learning Technique for the Characteristic of Line Tunnel Field-Effect Transistors. IEEE Access 10: 53098-53107 (2022)

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