"Fast Witness Generation for Readable GUI Test Scenarios via Generalized ..."

Yavuz Köroglu, Alper Sen (2024)

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DOI: 10.21227/VSHK-XA74

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type: Data or Artifact

metadata version: 2024-08-27

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Yavuz Köroglu, Alper Sen:
Fast Witness Generation for Readable GUI Test Scenarios via Generalized Experience Replay. IEEE DataPort, 2024

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