"Test Driven Development and Software Process Improvement in China."

Kim Man Lui, Keith C. C. Chan (2004)

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DOI: 10.1007/978-3-540-24853-8_27

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Kim Man Lui, Keith C. C. Chan:
Test Driven Development and Software Process Improvement in China. XP 2004: 219-222

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