"Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing."

Étienne Le Quéré et al. (2020)

> Home

Details and statistics

DOI: 10.1109/WSC48552.2020.9384001

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/wsc/QuereDTMA20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/wsc/QuereDTMA20
Étienne Le Quéré, Stéphane Dauzère-Pérès, Karim Tamssaouet, Cédric Maufront, Stéphane Astie:
Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing. WSC 2020: 1886-1897

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.