"A Generic VMI Measurement and Application in the semiconductor Industry."

Hans Ehm et al. (2018)

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DOI: 10.1109/WSC.2018.8632431

access: closed

type: Conference or Workshop Paper

metadata version: 2019-03-28

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  - https://dblp.org/rec/conf/wsc/EhmJFLN18
Hans Ehm, Frederic Jankowiak, Veronika Filser, Tim Lauer, Anh Nguyen:
A Generic VMI Measurement and Application in the semiconductor Industry. WSC 2018: 3449-3460

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