"Modeling fatigue life of power semiconductor devices with ε-N fields."

Olivia Bluder et al. (2014)

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DOI: 10.1109/WSC.2014.7020105

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - https://dblp.org/rec/conf/wsc/BluderPNHL14
Olivia Bluder, Kathrin Plankensteiner, Michael Nelhiebel, Walther Heinz, Christian Leitner:
Modeling fatigue life of power semiconductor devices with ε-N fields. WSC 2014: 2609-2616

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