"DefectClassifierX: A Cross-Platform Automated Pattern Classification ..."

Amjad Rattrout, Hussein Younis, Ahmad Bsiesy (2024)

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DOI: 10.1007/978-981-96-0573-6_29

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-22

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Amjad Rattrout, Hussein Younis, Ahmad Bsiesy:
DefectClassifierX: A Cross-Platform Automated Pattern Classification System for Wafer Defects. WISE (4) 2024: 392-405

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