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"Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection."

Gongjie Zhang et al. (2021)

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DOI: 10.1109/WACV48630.2021.00257

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-18

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  dblp key:
  - conf/wacv/ZhangCHL21
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  - https://dblp.org/rec/conf/wacv/ZhangCHL21
Gongjie Zhang, Kaiwen Cui, Tzu-Yi Hung, Shijian Lu:
Defect-GAN: High-Fidelity Defect Synthesis for Automated Defect Inspection. WACV 2021: 2523-2533

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