"Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT ..."

Shi-Xuan Zheng et al. (2022)

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DOI: 10.1109/VTS52500.2021.9794207

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-22

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Shi-Xuan Zheng, Chung-Yu Yeh, Kuen-Jong Lee, Chen Wang, Wu-Tung Cheng, Mark Kassab, Janusz Rajski, Sudhakar M. Reddy:
Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations. VTS 2022: 1-7

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