"A novel test generation approach for parametric faults in linear analog ..."

Hong Helena Zheng, Ashok Balivada, Jacob A. Abraham (1996)

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DOI: 10.1109/VTEST.1996.510895

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hong Helena Zheng, Ashok Balivada, Jacob A. Abraham:
A novel test generation approach for parametric faults in linear analog circuits . VTS 1996: 470-475

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