"Random pattern generation for post-silicon validation of DDR3 SDRAM."

Hao-Yu Yang et al. (2015)

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DOI: 10.1109/VTS.2015.7116287

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hao-Yu Yang, Shih-Hua Kuo, Tzu-Hsuan Huang, Chi-Hung Chen, Chris Lin, Mango Chia-Tso Chao:
Random pattern generation for post-silicon validation of DDR3 SDRAM. VTS 2015: 1-6

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