"Delay testing and failure analysis of ECL logic with embedded memories."

Kyle G. Welch et al. (1991)

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DOI: 10.1109/VTEST.1991.208167

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kyle G. Welch, James A. Monzel, Donald S. Kent, Donald W. Joseph:
Delay testing and failure analysis of ECL logic with embedded memories. VTS 1991: 254-259

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