"Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric."

Zheng Wang, Duncan M. Hank Walker (2009)

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DOI: 10.1109/VTS.2009.55

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zheng Wang, Duncan M. Hank Walker:
Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric. VTS 2009: 59-64

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