"An Incremental Automatic Test Pattern Generation Method for Multiple ..."

Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita (2019)

> Home

Details and statistics

DOI: 10.1109/VTS.2019.8758668

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vts/WangGF19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/WangGF19
Peikun Wang, Amir Masoud Gharehbaghi, Masahiro Fujita:
An Incremental Automatic Test Pattern Generation Method for Multiple Stuck-at Faults. VTS 2019: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.