"Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling."

R. de Vries, Augustus J. E. M. Janssen (1998)

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DOI: 10.1109/VTEST.1998.670894

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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R. de Vries, Augustus J. E. M. Janssen:
Decreasing the Sensitivity of ADC Test Parameters by Means of Wobbling. VTS 1998: 386-393

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