"Keynote address: Challenges and opportunities in electrical ..."

Andrzej J. Strojwas et al. (2016)

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DOI: 10.1109/VTS.2016.7477260

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Andrzej J. Strojwas, Jacob A. Abraham, Hong Hao, Max M. Shulaker:
Keynote address: Challenges and opportunities in electrical characterization and test for 14nm and below. VTS 2016: 1-2

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