"The effect of defect clustering on test transparency and defect levels."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Adit D. Singh, C. Mani Krishna (1993)

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DOI: 10.1109/VTEST.1993.313301

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/vts/SinghK93
Adit D. Singh, C. Mani Krishna:
The effect of defect clustering on test transparency and defect levels. VTS 1993: 99-105

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