"Improved Test Monitor Circuit in Power Pin DfT."

Rodger Schuttert, Frans G. M. de Jong, Ben Kup (2002)

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DOI: 10.1109/VTS.2002.1011163

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rodger Schuttert, Frans G. M. de Jong, Ben Kup:
Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350

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