"Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks."

Victor M. van Santen et al. (2021)

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DOI: 10.1109/VTS50974.2021.9441053

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch:
Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks. VTS 2021: 1-7

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