"Characterization of 14nm CMOS Technology At Cryogenic Temperatures Using ..."

Raphael Robertazzi et al. (2024)

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DOI: 10.1109/VTS60656.2024.10538856

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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Raphael Robertazzi, David J. Frank, Kevin Tien, John Timmerwilke, Peilin Song, Daniel J. Friedman:
Characterization of 14nm CMOS Technology At Cryogenic Temperatures Using Dense Addressable Arrays. VTS 2024: 1-7

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