"Static test compaction for delay fault test sets consisting of broadside ..."

Irith Pomeranz (2011)

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DOI: 10.1109/VTS.2011.5783760

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Irith Pomeranz:
Static test compaction for delay fault test sets consisting of broadside and skewed-load tests. VTS 2011: 84-89

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