"Enhanced fault modeling for DRAM test and analysis."

H.-D. Oberle, M. Maue, Peter Muhmenthaler (1991)

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DOI: 10.1109/VTEST.1991.208150

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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H.-D. Oberle, M. Maue, Peter Muhmenthaler:
Enhanced fault modeling for DRAM test and analysis. VTS 1991: 149-154

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