"Input pattern classification for transistor level testing of BiCMOS circuits."

Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya (1994)

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DOI: 10.1109/VTEST.1994.292273

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya:
Input pattern classification for transistor level testing of BiCMOS circuits. VTS 1994: 457-462

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