"Implications of Voltage and Dimension Scaling on CMOS Testing: The ..."

Ovidio V. Maiuri, Will R. Moore (1998)

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DOI: 10.1109/VTEST.1998.670844

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ovidio V. Maiuri, Will R. Moore:
Implications of Voltage and Dimension Scaling on CMOS Testing: The Multidimensional Testing Paradigm. VTS 1998: 22-27

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