"SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on ..."

Xijiang Lin et al. (2000)

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DOI: 10.1109/VTEST.2000.843847

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xijiang Lin, Wu-Tung Cheng, Irith Pomeranz, Sudhakar M. Reddy:
SIFAR: Static Test Compaction for Synchronous Sequential Circuits Based on Single Fault Restoration. VTS 2000: 205-212

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