"Modeling and Testing Comparison Faults for Ternary Content Addressable ..."

Jin-Fu Li, Chou-Kun Lin (2005)

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DOI: 10.1109/VTS.2005.57

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Jin-Fu Li, Chou-Kun Lin:
Modeling and Testing Comparison Faults for Ternary Content Addressable Memories. VTS 2005: 60-65

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