"Fast WAT test structure for measuring Vt variance based on latch-based ..."

Kao-Chi Lee et al. (2017)

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DOI: 10.1109/VTS.2017.7928928

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kao-Chi Lee, Kai-Chiang Wu, Chih-Ying Tsai, Mango Chia-Tso Chao:
Fast WAT test structure for measuring Vt variance based on latch-based comparators. VTS 2017: 1-6

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