"Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits."

Kyung Tek Lee, Clay Nordquist, Jacob A. Abraham (1998)

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DOI: 10.1109/VTEST.1998.670846

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kyung Tek Lee, Clay Nordquist, Jacob A. Abraham:
Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits. VTS 1998: 34-41

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