"CCSTG: an efficient test pattern generator for sequential circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Kyuchull Kim, Kewal K. Saluja (1993)

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DOI: 10.1109/VTEST.1993.313304

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kyuchull Kim, Kewal K. Saluja:
CCSTG: an efficient test pattern generator for sequential circuits. VTS 1993: 79-84

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