"Testing retention flip-flops in power-gated designs."

Hao-Wen Hsu et al. (2013)

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DOI: 10.1109/VTS.2013.6548880

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/HsuKCCCC13
Hao-Wen Hsu, Shih-Hua Kuo, Wen-Hsiang Chang, Shi-Hao Chen, Ming-Tung Chang, Mango Chia-Tso Chao:
Testing retention flip-flops in power-gated designs. VTS 2013: 1-6

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