"Enhanced Wear-Out Sensor Design in a 12nm Process for Separable Stress ..."

Ian Hill, Mateo Rendón, André Ivanov (2024)

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DOI: 10.1109/VTS60656.2024.10538772

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Ian Hill, Mateo Rendón, André Ivanov:
Enhanced Wear-Out Sensor Design in a 12nm Process for Separable Stress Regime Monitoring. VTS 2024: 1-7

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