"A framework for fast test generation at the RTL."

Kelson Gent, Akash Agrawal, Michael S. Hsiao (2017)

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DOI: 10.1109/VTS.2017.7928942

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/GentAH17
Kelson Gent, Akash Agrawal, Michael S. Hsiao:
A framework for fast test generation at the RTL. VTS 2017: 1-6

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