"Fault detection and fault localization using IDDQ-testing in ..."

Christian Elm, Djamshid Tavangarian (1994)

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DOI: 10.1109/VTEST.1994.292285

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Christian Elm, Djamshid Tavangarian:
Fault detection and fault localization using I_DDQ-testing in parallel testable FAST-SRAMs. VTS 1994: 380-385

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