"Modeling the effects of imperfect production testing on reconfigurable ..."

Bruno Ciciani (1991)

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DOI: 10.1109/VTEST.1991.208149

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Bruno Ciciani:
Modeling the effects of imperfect production testing on reconfigurable VLSI chips. VTS 1991: 143-148

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