"An industrial experience in the built-in self test of embedded RAMs."

Paolo Camurati et al. (1994)

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DOI: 10.1109/VTEST.1994.292296

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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  - https://dblp.org/rec/conf/vts/CamuratiPRBBM94
Paolo Camurati, Paolo Prinetto, Matteo Sonza Reorda, Stefano Barbagallo, Andrea Burri, Davide Medina:
An industrial experience in the built-in self test of embedded RAMs. VTS 1994: 306-311

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