"Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS."

Th. Calin, Lorena Anghel, Michael Nicolaidis (1999)

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DOI: 10.1109/VTEST.1999.766657

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Th. Calin, Lorena Anghel, Michael Nicolaidis:
Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. VTS 1999: 135-142

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