"Test Pattern Generation for Signal Integrity Faults on Long Interconnects."

Amir Attarha, Mehrdad Nourani (2002)

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DOI: 10.1109/VTS.2002.1011162

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Amir Attarha, Mehrdad Nourani:
Test Pattern Generation for Signal Integrity Faults on Long Interconnects. VTS 2002: 336-344

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