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"Small Delay Fault Model for Intra-Gate Resistive Open Defects."
Masayuki Arai et al. (2009)
- Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo:
Small Delay Fault Model for Intra-Gate Resistive Open Defects. VTS 2009: 27-32
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