"An efficient test data reduction technique through dynamic pattern mixing ..."

Srinivasulu Alampally et al. (2011)

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DOI: 10.1109/VTS.2011.5783735

access: closed

type: Conference or Workshop Paper

metadata version: 2018-12-05

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Srinivasulu Alampally, R. T. Venkatesh, Priyadharshini Shanmugasundaram, Rubin A. Parekhji, Vishwani D. Agrawal:
An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. VTS 2011: 285-290

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