"Boosting the Memory Window of the BEOL-Compatible MFMIS Ferroelectric/ ..."

Zijie Zheng et al. (2022)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830466

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type: Conference or Workshop Paper

metadata version: 2024-10-25

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Zijie Zheng, Chen Sun, Leming Jiao, Dong Zhang, Zuopu Zhou, Xiaolin Wang, Gan Liu, Qiwen Kong, Yue Chen, Kai Ni, Xiao Gong:
Boosting the Memory Window of the BEOL-Compatible MFMIS Ferroelectric/ Anti-Ferroelectric FETs by Charge Injection. VLSI Technology and Circuits 2022: 389-390

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