"First Demonstration of 1-bit Erase in Vertical NAND Flash Memory."

Honam Yoo et al. (2022)

> Home

Details and statistics

DOI: 10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830445

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsit/YooBKKPL22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsit/YooBKKPL22
Honam Yoo, Jong-Won Back, Nam-Hun Kim, Dongseok Kwon, Byung-Gook Park, Jong-Ho Lee:
First Demonstration of 1-bit Erase in Vertical NAND Flash Memory. VLSI Technology and Circuits 2022: 304-305

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.