"HZO-based Nonvolatile SRAM Array with 100% Bit Recall Yield and Sufficient ..."

Yusuke Shuto et al. (2024)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46783.2024.10631328

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type: Conference or Workshop Paper

metadata version: 2024-10-17

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Yusuke Shuto, Jun Okuno, Tsubasa Yonai, Ryo Ono, Peter Reinig, Maximilian Lederer, Konrad Seidel, Ruben Alcala, Thomas Mikolajick, Uwe Schroeder, Taku Umebayashi, Kentaro Akiyama:
HZO-based Nonvolatile SRAM Array with 100% Bit Recall Yield and Sufficient Retention Time at 85°C. VLSI Technology and Circuits 2024: 1-2

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