"First Observation of Time Exponent Variations under Positive bias Stress ..."

Taewon Seo, Changeon Jin, Yoonyoung Chung (2024)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46783.2024.10631423

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-17

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Taewon Seo, Changeon Jin, Yoonyoung Chung:
First Observation of Time Exponent Variations under Positive bias Stress on a-IGZO Transistors Utilizing Ultrafast On-the-Fly Technique with 1 μs Delay. VLSI Technology and Circuits 2024: 1-2

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