"Thickness-Engineered Extremely-thin Channel High Performance ITO TFTs with ..."

Yuye Kang et al. (2023)

> Home

Details and statistics

DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185421

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vlsit/KangHCG23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsit/KangHCG23
Yuye Kang, Kaizhen Han, Yue Chen, Xiao Gong:
Thickness-Engineered Extremely-thin Channel High Performance ITO TFTs with Raised S/D Architecture: Record-Low RSD, Highest Moblity (Sub-4 nm TCH Regime), and High VTH Tunability. VLSI Technology and Circuits 2023: 1-2

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.