"Assessment of the Transient Self-Heating Effect and its Impact on the ..."

T. V. Dinh et al. (2024)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46783.2024.10631465

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type: Conference or Workshop Paper

metadata version: 2024-10-17

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T. V. Dinh, S.-W. Tam, A. J. Scholten, L. Tondelli, R. M. T. Pijper, S. H. Kondapalli, J. Xie, A. Wong, I. To, R. Asanovski, L. Selmi:
Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology. VLSI Technology and Circuits 2024: 1-2

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