"Machine Learning Assisted Statistical Variation Analysis of Ferroelectric ..."

Gihun Choe et al. (2022)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830392

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type: Conference or Workshop Paper

metadata version: 2023-03-21

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Gihun Choe, Prasanna Venkatesan Ravindran, Anni Lu, Jae Hur, Maximilian Lederer, André Reck, Sarah Lombardo, Nashrah Afroze, Josh Kacher, Asif Islam Khan, Shimeng Yu:
Machine Learning Assisted Statistical Variation Analysis of Ferroelectric Transistors: From Experimental Metrology to Predictive Modeling. VLSI Technology and Circuits 2022: 336-337

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