"How Fault-Tolerant Quantum Computing Benefits from Cryo-CMOS Technology."

H.-L. Chiang et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185325

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type: Conference or Workshop Paper

metadata version: 2024-07-29

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H.-L. Chiang, Richard A. Hadi, J.-F. Wang, H.-C. Han, J.-J. Wu, H.-H. Hsieh, J.-J. Horng, W.-S. Chou, B.-S. Lien, C.-H. Chang, Y.-C. Chen, Yeong-Her Wang, T.-C. Chen, J.-C. Liu, Y.-C. Liu, Meng-Hsueh Chiang, K.-H. Kao, B. Pulicherla, J. Cai, C.-S. Chang, K.-W. Su, K.-L. Cheng, T.-J. Yeh, Y.-C. Peng, C. Enz, Mau-Chung Frank Chang, M.-F. Chang, H.-S. Philip Wong, Iuliana P. Radu:
How Fault-Tolerant Quantum Computing Benefits from Cryo-CMOS Technology. VLSI Technology and Circuits 2023: 1-2

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